Scientists

Research Group Leader: Krzysztof Radwański, PhD, DSc, tel. +48 (32) 23 45 234, e-mail: krzysztof.radwanski@imz.lukasiewicz.gov.pl
Research Group Deputy Leader: Radosław Swadźba, PhD, tel. +48 (32) 23 45 201, e-mail: radoslaw.swadzba@imz.lukasiewicz.gov.pl

Jarosław Gazdowicz, PhD
Zofia Kania-Pifczyk, PhD
Liwia Sozańska-Jędrasik, PhD
Aleksandra Janik, MSc
Witosław Kubosz, MSc
Paweł Michalik, MSc
Przemysław Pełka, MSc
Radosław Rozmus, MSc
Piotr Stawarczyk, Eng.
Tomasz Hala
Janusz Kuczmera
Marzanna Marczak
Adam Mazurkiewicz

Equipment

A portable Pulstec µ-X360s X-ray analyzer to measure residual stresses

The Pulstec µ-X360s portable X-ray analyzer for residual stress measurements is equipped with an air-cooled Cr X-ray tube and a 2D detector. Calculations are made using the cosα.

JEOL JSM-7200F high-resolution scanning electron (SEM)

JEOL JSM-7200F high-resolution scanning electron (SEM) microscope equipped with EDAX EDS (Octane Elite Super) and EBSD detectors (Hikari Plus) and a Fischione tool for sample preparation for EBSD testing

Ultra–high resolution (S/TEM) scanning-transmission electron microscope TITAN 80-300

The microscope is equipped with energy dispersive spectrometer (EDS), outer electron energy filter for EFTEM imaging and EELS spectroscopy, set of three detectors BF/ADF/HAADF for scanning mode, low field Lorentz lens and tomograph “wide-field-of-view” holder.

Scanning electron microscope Quanta 3D 200i

The microscope features operation in three modes: high-vacuum, low-vacuum (10-130 Pa) and environmental (130-2600 Pa) as well as an equipment for ion preparation of S/TEM samples. It is equipped with the following detectors SE, LF-GSED, GSED, GAD-BSE and EDS. Accelerating voltage for electrons 0.2 – 30 kV and ions 2-30 kV.

Inspect F Scanning electron microscope

The microscope is equipped with SE, BSE, EDS, WDS and EBSD detectors. Electron beams accelerating voltage ranges from 200V do 30kV.
Resolution for SE detector is 1.2 nm at 30kV and 3.0 nm at 1kV, while for BSE 2.5 nm at 30 kV.
The range of feasible magnifications of microscope is from 12 to 2 000 000x. EDS and WDS detectors facilitate precise analysis of chemical composition of materials in micro regions. Processing of data obtained by means of EBSD detector (backscattered electron diffraction) allows to obtain lots of information on crystallographic structure of material.

Optical and digital microscope OLYMPUS DSX500i

Advanced optical microscope with integrated optical and digital head for operations in bright and dark field of view, in polarized light and Nomarski contrast.

X-ray Empyrean diffractometer by PANalytical for analyses of phase composition of polycrystalline materials

The diffractometer purchased by Materials Properties and Structure Laboratory was subsidized from the Polish Science and Technology Fund.Assembly and start-up was carried out in 2011.
Scope of the offered analyses: phase identification of inorganic compounds based on PDF-4+ base updated annually quantitative phase analysis by the Rietveld method, including determination of amorphous constituent share precise measurement of lattice constant.

Gravity drop hammer Zwick/Roell RKP 450

The machine is used for execution of impact test by means of Charpy method using two types of striker of various edge rounding radius and initial energy 300J and 450J.

Zwick/Roell Z250 strength testing device; strength range up to 250kN

The machine is used for static tensile tests, compression and bending of samples of any shape, at room temperature. Testing of deformation during the test is effected by means of extensometers for measurement of change in length and width, which are located directly on the sample. Maximum range of the applied force is 250 kN.

Zwick/Roell Z100 testing machine for tests at elevated temperature up to 1200°C

The machine is used for execution of static tensile tests at room temperature and temperature elevated to 1200^oC . Examination of deformation during testing is executed by means of ceramic extensometer for measurement of changes in sample length during test. Maximum range of applied force is 100 kN.

Microhardness tester Future-Tech FM-700

Future-Tech FM-700 micro hardness tester is used for testing of hardness by means of use of Vickers’ (HV) and Knoop (HK) indenter, at load ranging from 98.07 – 9807mN. With option of automatic execution of hardness distribution according to any measurement track.

Universal hardness testing machine Swiss Max 300

Universal hardness testing machine Swiss Max is used for testing of hardness by means of Brinell, Vickers and Rockwell methods with maximum load of indenter of 2452N.